About the role
- Lead development of iJTAG (IEEE 1687) based test solutions, including scan network modeling, instrument access, and test pattern execution.
• Design and implement DFT methodologies including scan, BIST, and hierarchical access mechanisms.
• Build AI/ML features in DFT tools for pattern compaction, failure prediction, and scan-failure root-cause analysis
• Develop scalable automation frameworks in Python/C++ and streamline DFT workflows using Tcl/Perl/Shell
• Build APIs and pipelines for Large-scale data ingestion (ATE logs, STIL/WGL patterns) and data processing and visualization dashboards
BE/ME Computer Science, Electronics Engineering or related professions with at least 2-5 years working experience in software development
• Understanding of Basic DFT concepts (scan chains, testability basics) and semiconductor testing fundamentals
• Strong programming expertise in C,C++ or Python and experience in data structures, algorithms, and scalable system design in Linux OS
• Strong attention to details, verbal communication and written skill sets, and ability to work with a highly diverse team-structured environment with positive attitude is mandatory
• Ability to work in a fast paced, project oriented, team environment and escalate any critical issues to the senior management.
Desired
• Exposure to ATE platforms (V93000 or similar) Linux-based development
• Basic knowledge of iJTAG / IEEE 1687 concepts
• Contributions to test optimization/yield improvement frameworks
• Interest or exposure to AI/ML data analysis, automation, or simple ML models applied to test/debug